An Inquiry Concerning the Principles of Si 2p Core-Level Photoemission Shift Assignments at the Si/SiO 2 Interface.

F. R. McFeely, K. Z. Zhang, M. M. Banaszak Holl, S. Lee, J. E. Bender. J. Vac. Sci. Technol. B 1996 14 2824
See: Bender IV, John E.Lee, Sunghee Zhang, Kangzhan