Schneider, Kevin


Bachelor of Science
St. Lawrence University, Canton, NY, 1998


Doctor of Philosophy

University of Michigan, 2003

About this team member

Kevin’s research project entailed the characterization of surface/adsorbate systems using scanning probe microscopy, particularly scanning tunneling microscopy (STM). In particular, his project involved the characterization of model interfacial systems synthesized by the reaction of silanes and spherosiloxanes with crystalline Si and Au surfaces. Kevin presented his research at the 2002 Boston ACS meeting and won the Top Student Poster Award in physical chemistry.  Kevin published his first and last papers from the group in Physical Review Letters.

After graduation, Dr. Schneider was an NRC Postdoctoral Research Fellow at the Naval Research Laboratory in Washington D.C. where he researched CVD synthesis of carbon nanotubes, Si nanowires and related nanoelectronic devices. After leaving the NRL, Kevin worked in the lead development 300mm wafer fab of Intel Corporation in Hillsboro, Oregon first as a thin films/dielectrics Process Engineer and then as a “front-end of the line” Process Integration Engineer. While at Intel, he helped develop and ramp to high volume logic processors at the 65nm and 45nm technology nodes. Kevin then worked as a Research Scientist in the Optoelectronics R&D group of Cree Inc. in Durham, North Carolina where he developed new LED products and including light bulbs you probably use in your house.  He was a technical manager for Semprius in Henderson, North Carolina working in the in the high concentration photovoltaic (CPV) solar industry.  He is currently Senior Process Engineer for Phononic.

Below are atomic resolution STM images obtained by Kevin.


  • Monolayer Pattern Evolution via Substrate Strain-Mediated Spinodal Decomposition. Phys. Rev. Lett. 2004 93 116104
  • Oxidation of Alkylsilane-based Monolayers on Gold. Langmuir 2004 20 9636-9645.
  • Simulated Scanning Tunneling Microscopy Images of Three-Dimensional Clusters: H8Si8O12 on Si(100)-2×1. Phys. Rev. B 2004 70 85402
  • Chemical Imaging of Terrace-Based Active Sites on Gold, K. Langmuir 2004 20 2250-2256.
  • Dynamic In Situ Characterization of Novel Substrate-Mediated Organic Monolayer Pattern Formation, K. Langmuir 2004 20 1258-1268.
  • The Case of the Disappearing Monolayer: Alkylsilane Monolayer Formation, Oxidation, and Subsequent Transparency to Scanning Tunneling Microscopy, K. Chemphyschem 2003 10 1111-1114.
  • The differential reactivity of octahydridosilsesquioxane on Si(100)-2×1 and Si(111)-7×7: A comparative experimental study. Ultramicroscopy 2003 97 35-45.
  • The Effect of Surface Reconstruction on Molecular Chemisorption: A Scanning Tunneling Microscopy Study of H8Si8O12 Clusters on Au(111) 23 ´ Ö 3. Langmuir 2002 18 8116-8122.
  • Investigation of Hydridosilsesquioxane-Based Silicon Oxide Deposition on Si(111)-7´7. Langmuir 2002 18 6233-6241.
  • Determination of Spherosiloxane Cluster Bonding to Si(100)-2´1 by Scanning Tunneling Microscopy K. Phys. Rev. Lett. 2000 85 602